Modulkataloge
Name des Moduls |
[350260] Advanced Characterization Tools II |
Modulcode |
MMC W006 |
|
Studiengang |
[733] Chemistry of Materials |
ECTS Punkte |
5 LP |
|
Arbeitsaufwand für Selbststudium |
75 Stunden |
Häufigkeit des Angebotes (Modulturnus) |
jedes 2. Semester (ab Wintersemester) |
Arbeitsaufwand in Präsenzstunden |
75 Stunden |
Dauer des Moduls |
1 Semester |
Arbeitsaufwand Summe (Workload) |
150 Stunden |
|
|
|
Modulverantwortlicher |
Prof. Dr Andrey Tuchanin, Prof. Dr Volker Deckert, Prof. Dr Benjamin Dietzek-Ivansic |
Voraussetzungen für die Vergabe von Leistungspunkten |
Exam/test on the content dealt with in the lecture, seminar, and laboratory practical content (75%), laboratory reports (25%) |
Zusätzliche Informationen zum Modul |
If „Advanced Characterization Tools II“ is chosen, then Advanced Characterization Tools I“ has to be chosen as well. The module can also be chosen as an elective module in „individual specialization“, if not already completedas „required specialization“. |
Literatur |
Will be recommended at the beginning of the module. |
Unterrichtssprache |
English |
Voraussetzungen für die Zulassung zum Modul |
733 MSc Chemistry of Materials: none |
Vorkenntnisse |
733 MSc Chemistry of Materials: none |
Verwendbarkeit (Voraussetzung wofür) |
733 MSc Chemistry of Materials: Module required to complete master’s thesis |
Art des Moduls |
733 MSc Chemistry of Materials: Elective module in „required specialisation“ |
Zusammensetzung des Moduls / Lehrformen |
Lecture (3 SWS), seminar (1 SWS), laboratory practical (1 SWS) (SWS stands for‚ hours per week per semester) |
Inhalte |
Spectroscopic and spectrometric characterization tools to characterize the chemical and electronic structure of materials. The module covers the physical and chemical basis underlying individual characterization tools, and derive the information content that can be obtained from the individual tools. In addition, the module also deals with UV/Vis absorption spectroscopy, emission spectroscopy (including FRET and confocal microscopy), Raman, resonance Raman and Brillouin scattering, IR absorption spectroscopy, X-ray absorption spectroscopy (XPS and XANES), Auger spectroscopy, photoelectron spectroscopy, and AFM and STM spectroscopy. |
Lern- und Qualifikationsziele |
Upon successful completion of the module, students have advanced knowledge of concepts of spectroscopy and spectrometry to characterise materials. Through the lecture and seminar they know the theoretical background, including aspects of data analysis, while through the laboratory practical course they learn in-depth knowledge of data evaluation and the interpretation of experimental results using selected methods and are able to apply these. |
Voraussetzung für die Zulassung zur Modulprüfung (Prüfungsvorleistungen) |
none |
Sie befinden sich hier:
MMC W006 ... Advanced Characterization Tools II
MMC W006 ... Advanced Characterization Tools II