Modulkataloge
Name des Moduls |
[350240] Advanced Characterization Tools I |
Modulcode |
MMC W004 |
|
Studiengang |
[733] Chemistry of Materials |
ECTS Punkte |
5 LP |
|
Arbeitsaufwand für Selbststudium |
75 Stunden |
Häufigkeit des Angebotes (Modulturnus) |
jedes 2. Semester (ab Sommersemester) |
Arbeitsaufwand in Präsenzstunden |
75 Stunden |
Dauer des Moduls |
1 Semester |
Arbeitsaufwand Summe (Workload) |
150 Stunden |
|
|
|
Modulverantwortlicher |
Prof. Dr Felix Schacher, Prof. Dr Lotar Wondraczek |
Voraussetzungen für die Vergabe von Leistungspunkten |
Written reports on laboratory practical (70%) and oral presentation with subsequent discussion (30%) |
Zusätzliche Informationen zum Modul |
Laboratory practical in tandems A presentation or a written report graded as failed can be repeated once. If „Advanced Characterization Tools I“ is chosen, then „Advanced Characterization Tools II“ has to be chosen as well. The module can also be chosen as an elective module in „individual specialization“, if not already compled as „required specialization“. |
Literatur |
Will be recommended at the beginning of the module.
|
Unterrichtssprache |
English |
Voraussetzungen für die Zulassung zum Modul |
733 MSc Chemistry of Materials: none |
Vorkenntnisse |
733 MSc Chemistry of Materials: none |
Verwendbarkeit (Voraussetzung wofür) |
733 MSc Chemistry of Materials: Module required to complete master’s thesis |
Art des Moduls |
733 MSc Chemistry of Materials: Elective module in „required spezcialisation“ |
Zusammensetzung des Moduls / Lehrformen |
Seminar (1 SWS), laboratory practical (4 SWS) (SWS stands for‚ hours per week per semester) |
Inhalte |
This module focuses on advanced characterization techniques for the investigation of morphology, size/size distribution or composition of nanostructured materials. Methods introduced to the students will include electron microscopy, i.e. transmission (TEM), scanning (SEM), and cryogenic transmission (cryo-TEM), scattering techniques (light or X-Ray, small and wide angle), powder diffraction, X-Ray spectroscopy etc. |
Lern- und Qualifikationsziele |
At the end of the module, students are acquainted with advanced characterization methods of nanostructured materials, and are able to apply them and their combinations to state-of-the-art questions in this research field. Additionally, students learn how to solve problems in small groups, to present and defend their solutions in front of a larger audience. |
Voraussetzung für die Zulassung zur Modulprüfung (Prüfungsvorleistungen) |
Regular participation in seminars and laboratory course during the semester |
Sie befinden sich hier:
MMC W004 ... Advanced Characterization Tools I
MMC W004 ... Advanced Characterization Tools I